双膜量子点表面热流密度场测量技术

doi:10.16085/j.issn.1000-6613.2023-2089

摘要/Abstract

摘要：

现有热流密度场测量技术主要局限在分辨率低、瞬态响应慢、成本高等方面。为解决这一问题，本文提出了一种测量热流密度场的新技术。量子点是一种纳米级的光致发光半导体材料，其光致荧光光谱强度随温度的变化呈现线性变化趋势。基于该效应，设计并制作了双膜量子点试片，搭建了量子点热流密度场测量实验系统，开展了标定与测量实验。结果表明：在本研究实验范围内，量子点膜的平均光致荧光强度随温度的升高呈现线性下降趋势；测得在本研究实验条件下10s内纯水液滴受热蒸发过程中底层平均热流密度约为3.4×10⁴W/m²，测量不确定度为0.14；本研究测量方法的空间分辨率可达30μm级，响应时间为秒级，实现了对表面热流密度场的高分辨率、低延迟测量。基于分辨率高、延迟低的优势，本研究可以有效应用于旋转叶片、高速飞行器、微纳米元件等传统测量方法难以开展的测试环境。

关键词: 量子点, 纳米材料, 热流密度, 测量, 不确定度, 分辨率, 瞬态响应

Abstract:

Existing techniques for heat flux field measurement are mainly limited to low resolution, slow transient response, and high cost. To solve this problem, a new technique for heat flux field measurement is proposed. Quantum dots are nanoscale photoluminescent semiconductor materials whose photoluminescence spectral intensity shows a linear trend with temperature. Based on this effect, a dual-film quantum dots sample was designed and fabricated, and an experimental system for heat flux field measurement was constructed. Through calibration and measurement experiments, the study demonstrates that the average photoluminescence intensity of the quantum dots film declines linearly with increasing temperature within the tested range. The average heat flux of the bottom during the thermal evaporation of the pure water droplet in 10s under the experimental conditions was measured to be about 3.4×10⁴W/m². And the uncertainty of the heat flux measurement was calculated to be 0.14. The spatial resolution of this method can be up to the 30μm level, and the response time is of the second level, which realizes the high-resolution and low-delay measurement of the heat flux field on the surface. Based on the advantages of high resolution and low latency, this study holds significant potential for challenging testing environments where traditional methods fall short, such as rotating blades, high-speed aircraft, and micro- and nano-components.

Key words: quantum dots, nanomaterials, heat flux, measurement, uncertainty, resolution, transient response

中图分类号:

TK124

王一笑, 张丹, 涂茂萍, 周文博, 赵冰超. 双膜量子点表面热流密度场测量技术[J]. 化工进展, 2024, 43(2): 872-881.

WANG Yixiao, ZHANG Dan, TU Maoping, ZHOU Wenbo, ZHAO Bingchao. Heat flux field measurement technique by dual-film quantum dots[J]. Chemical Industry and Engineering Progress, 2024, 43(2): 872-881.

图/表 16

图1 CdTe/CdS/ZnS量子点溶液实物图

图2 水溶性CdTe/CdS/ZnS量子点结构

图3 CdTe/CdS/ZnS量子点的吸收和光致荧光光谱图

图4 双膜量子点试片结构图

图5 热流密度场测试系统

表1 系统部件参数

设备	型号	主要参数
CCD相机	GS3-U3-32S4M-C	帧频0~121fps；曝光时间0.005ms~32s；增益0~47dB；精度3.45×10^-6m
滤光片	ZLM-680， ZLM-600	带通波段680nm或600nm；透过率≥80%
紫外光源	光宏	波长395~400nm
温度控制器	C507	最小响应时间0.5s；精度0.5%
信号发生器	VC2015H	频率1μHz~100MHz；误差±5ppm
热电偶	T型	温度范围-200~350℃；丝径0.5mm；精度0.5℃
温度计	HT-9815	温度范围-200~1372℃；精度0.1℃
稳压电源	IT6322A	输出电压0~30V，精度≤0.03%+10mV 输出电流0~3A，精度≤0.1%+5mA

图6 试片温度标定结果

图7 像素点标定矩阵示意图

图8 标定过程中试片表面温度场反演结果

图9 温度场的反演误差

图10 不确定度计算方法示意图

图11 不确定度测试结果

图12 液滴蒸发过程中底部热流密度场反演结果

图13 空间分辨率计算示例图

图14 响应时间示意图

图15 响应时间处理结果

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